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            Free, publicly-accessible full text available December 10, 2025
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            Recent years have witnessed increasing concerns towards unfair decisions made by machine learning algorithms. To improve fairness in model decisions, various fairness notions have been proposed and many fairness-aware methods are developed. However, most of existing definitions and methods focus only on single-label classification. Fairness for multi-label classification, where each instance is associated with more than one labels, is still yet to establish. To fill this gap, we study fairness-aware multi-label classification in this paper. We start by extending Demographic Parity (DP) and Equalized Opportunity (EOp), two popular fairness notions, to multi-label classification scenarios. Through a systematic study, we show that on multi-label data, because of unevenly distributed labels, EOp usually fails to construct a reliable estimate on labels with few instances. We then propose a new framework named Similarity s-induced Fairness (sγ -SimFair). This new framework utilizes data that have similar labels when estimating fairness on a particular label group for better stability, and can unify DP and EOp. Theoretical analysis and experimental results on real-world datasets together demonstrate the advantage of sγ -SimFair over existing methods on multi-label classification tasks.more » « less
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            Abstract After graphene was first exfoliated in 2004, research worldwide has focused on discovering and exploiting its distinctive electronic, mechanical, and structural properties. Application of the efficacious methodology used to fabricate graphene, mechanical exfoliation followed by optical microscopy inspection, to other analogous bulk materials has resulted in many more two-dimensional (2D) atomic crystals. Despite their fascinating physical properties, manual identification of 2D atomic crystals has the clear drawback of low-throughput and hence is impractical for any scale-up applications of 2D samples. To combat this, recent integration of high-performance machine-learning techniques, usually deep learning algorithms because of their impressive object recognition abilities, with optical microscopy have been used to accelerate and automate this traditional flake identification process. However, deep learning methods require immense datasets and rely on uninterpretable and complicated algorithms for predictions. Conversely, tree-based machine-learning algorithms represent highly transparent and accessible models. We investigate these tree-based algorithms, with features that mimic color contrast, for automating the manual inspection process of exfoliated 2D materials (e.g., MoSe2). We examine their performance in comparison to ResNet, a famous Convolutional Neural Network (CNN), in terms of accuracy and the physical nature of their decision-making process. We find that the decision trees, gradient boosted decision trees, and random forests utilize physical aspects of the images to successfully identify 2D atomic crystals without suffering from extreme overfitting and high training dataset demands. We also employ a post-hoc study that identifies the sub-regions CNNs rely on for classification and find that they regularly utilize physically insignificant image attributes when correctly identifying thin materials.more » « less
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            Multidimensional Item Response Theory (MIRT) is widely used in educational and psychological assessment and evaluation. With the increasing size of modern assessment data, many existing estimation methods become computationally demanding and hence they are not scalable to big data, especially for the multidimensional three-parameter and four-parameter logistic models (i.e., M3PL and M4PL). To address this issue, we propose an importance-weighted sampling enhanced Variational Autoencoder (VAE) approach for the estimation of M3PL and M4PL. The key idea is to adopt a variational inference procedure in machine learning literature to approximate the intractable marginal likelihood, and further use importance-weighted samples to boost the trained VAE with a better log-likelihood approximation. Simulation studies are conducted to demonstrate the computational efficiency and scalability of the new algorithm in comparison to the popular alternative algorithms, i.e., Monte Carlo EM and Metropolis-Hastings Robbins-Monro methods. The good performance of the proposed method is also illustrated by a NAEP multistage testing data set.more » « less
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